系統識別號 | U0002-2207201113525200 |
---|---|
DOI | 10.6846/TKU.2011.00809 |
論文名稱(中文) | 具累積損害過程之恆定應力加速退化測試 |
論文名稱(英文) | Constant-Stress Accelerated Degradation Tests under Cumulative Damage Process |
第三語言論文名稱 | |
校院名稱 | 淡江大學 |
系所名稱(中文) | 統計學系碩士班 |
系所名稱(英文) | Department of Statistics |
外國學位學校名稱 | |
外國學位學院名稱 | |
外國學位研究所名稱 | |
學年度 | 99 |
學期 | 2 |
出版年 | 100 |
研究生(中文) | 宋依玲 |
研究生(英文) | Yi-Ling Sung |
學號 | 698650024 |
學位類別 | 碩士 |
語言別 | 繁體中文 |
第二語言別 | |
口試日期 | 2011-07-20 |
論文頁數 | 30頁 |
口試委員 |
指導教授
-
蔡宗儒
委員 - 廖敏治 委員 - 蘇懿 |
關鍵字(中) |
加速退化檢定 累積損害過程 逆高斯分配 Wiener 隨機過程 |
關鍵字(英) |
Accelerated degradation test Cumulative damage process Inverse Gaussian distribution Wiener process. |
第三語言關鍵字 | |
學科別分類 | |
中文摘要 |
為了在有限的時間內推估高功率LED 晶粒的可靠度, 本論文使用雙應力變數對高功率LED 晶粒進行恆定應力加速退化測試實驗。假設加速退化實驗所收集的元件之累積損害退化資料服從Wiener 隨機過程, 我們建議以逆高斯分配建立了加速退化模型, 進而推導出產品壽命百分位數的點估計值及信賴下界。本文並以高功率LED 晶粒退化資料實例來說明本方法之應用。 |
英文摘要 |
It is difficult to evaluate the lifetimes of high reliable products in limited experimental time. In this thesis, statistical methods based on a two-variable constant-stress loading accelerated degradation test are developed to overcome this difficulty. Assuming the cumulative damage information of test units due to degradation has a Wiener process, the inverse Gaussian distribution is used to derive the lifetime percentiles and their low confidence bounds. A real example of LED chips data set is used to demonstrate the application of the proposed method. |
第三語言摘要 | |
論文目次 |
目錄 第一章緒論.... .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 1 1.1 研究背景.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 1 1.2 研究動機與目的.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 3 1.3 文獻探討與相關研究.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 4 第二章加速退化測試之統計推論.. .. .. .. .. .. .. .. .. .. .. .. .. .. 7 2.1 加速退化模型.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 7 2.2 選取加速變數之應力水準.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 10 2.3 壽命時間的百分位數之推論.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 13 第三章實例分析.... .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 15 第四章結論.... .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 26 附錄.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 27 參考文獻.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 28 圖目錄 2.1 Wiener 隨機過程. . . . . . . . . . . . . . . . . . . . . . . . . 8 3.2 高功率LED 晶粒在(35◦C,600mA) 組合下之累積損害圖. . . . . 17 3.3 高功率LED 晶粒在(55◦C,600mA) 組合下之累積損害圖. . . . . 18 3.4 高功率LED 晶粒在(70◦C,400mA) 組合下之累積損害圖. . . . . 19 3.5 高功率LED 晶粒在(70◦C,500mA) 組合下之累積損害圖. . . . . 20 3.6 高功率LED 晶粒在(70◦C,600mA) 組合下之累積損害圖. . . . . 21 3.7 高功率LED 晶粒百分位數之壽命(其中C=30(—–), C=40(- - -) 及C=50(-.-.-)) . . . . . . . . . . . . . . . . . . . . . . . . . 25 表目錄 3.1 實驗組合. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 3.2 轉換後之應力水準. . . . . . . . . . . . . . . . . . . . . . . . . 22 3.3 參數估計. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 3.4 當C = 30% 時不同百分位數之spL 和spL,LB . . . . . . . . . . 24 3.5 當C = 40% 時不同百分位數之spL 和spL,LB . . . . . . . . . . 24 3.6 當C = 50% 時不同百分位數之spL 和spL,LB . . . . . . . . . . 24 |
參考文獻 |
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