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系統識別號 U0002-2207201113525200
中文論文名稱 具累積損害過程之恆定應力加速退化測試
英文論文名稱 Constant-Stress Accelerated Degradation Tests under Cumulative Damage Process
校院名稱 淡江大學
系所名稱(中) 統計學系碩士班
系所名稱(英) Department of Statistics
學年度 99
學期 2
出版年 100
研究生中文姓名 宋依玲
研究生英文姓名 Yi-Ling Sung
學號 698650024
學位類別 碩士
語文別 中文
口試日期 2011-07-20
論文頁數 30頁
口試委員 指導教授-蔡宗儒
委員-廖敏治
委員-蘇懿
中文關鍵字 加速退化檢定  累積損害過程  逆高斯分配  Wiener 隨機過程 
英文關鍵字 Accelerated degradation test  Cumulative damage process  Inverse Gaussian distribution  Wiener process. 
學科別分類 學科別自然科學統計
中文摘要 為了在有限的時間內推估高功率LED 晶粒的可靠度, 本論文使用雙應力變數對高功率LED 晶粒進行恆定應力加速退化測試實驗。假設加速退化實驗所收集的元件之累積損害退化資料服從Wiener 隨機過程, 我們建議以逆高斯分配建立了加速退化模型, 進而推導出產品壽命百分位數的點估計值及信賴下界。本文並以高功率LED 晶粒退化資料實例來說明本方法之應用。
英文摘要 It is difficult to evaluate the lifetimes of high reliable products in limited experimental time. In this thesis, statistical methods based on a two-variable constant-stress loading accelerated degradation test are developed to overcome this difficulty. Assuming the cumulative damage information of test units due to degradation has a Wiener process, the inverse Gaussian distribution is used to derive the lifetime percentiles and their low confidence bounds. A real example of LED chips data set is used to demonstrate the application of the proposed method.
論文目次 目錄
第一章緒論.... .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 1
1.1 研究背景.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 1
1.2 研究動機與目的.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 3
1.3 文獻探討與相關研究.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 4
第二章加速退化測試之統計推論.. .. .. .. .. .. .. .. .. .. .. .. .. .. 7
2.1 加速退化模型.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 7
2.2 選取加速變數之應力水準.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 10
2.3 壽命時間的百分位數之推論.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 13
第三章實例分析.... .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 15
第四章結論.... .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 26
附錄.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 27
參考文獻.. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. .. 28

圖目錄
2.1 Wiener 隨機過程. . . . . . . . . . . . . . . . . . . . . . . . . 8
3.2 高功率LED 晶粒在(35◦C,600mA) 組合下之累積損害圖. . . . . 17
3.3 高功率LED 晶粒在(55◦C,600mA) 組合下之累積損害圖. . . . . 18
3.4 高功率LED 晶粒在(70◦C,400mA) 組合下之累積損害圖. . . . . 19
3.5 高功率LED 晶粒在(70◦C,500mA) 組合下之累積損害圖. . . . . 20
3.6 高功率LED 晶粒在(70◦C,600mA) 組合下之累積損害圖. . . . . 21
3.7 高功率LED 晶粒百分位數之壽命(其中C=30(—–), C=40(- - -)
及C=50(-.-.-)) . . . . . . . . . . . . . . . . . . . . . . . . . 25

表目錄
3.1 實驗組合. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
3.2 轉換後之應力水準. . . . . . . . . . . . . . . . . . . . . . . . . 22
3.3 參數估計. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
3.4 當C = 30% 時不同百分位數之spL 和spL,LB . . . . . . . . . . 24
3.5 當C = 40% 時不同百分位數之spL 和spL,LB . . . . . . . . . . 24
3.6 當C = 50% 時不同百分位數之spL 和spL,LB . . . . . . . . . . 24


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